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SEM

  
 
 

Scanning Electron Microscopy (SEM) is a technique for examination of surfaces and particles at high magnification. A modern instrument may have a magnification factor of up to 500 000, although in most applications much lower magnification is used, usually 5000X.

In addition to studying surface properties, fibres and particles in air filter samples are counted and characterized by means of SEM.

  

The technique is even more powerful when combined with an X-ray unit which enables an analysis of the main components directly on a particle or fibre. Fluorescent radiation is then measured by an energy dispersive X-ray spectrometer (EDS). By using this accessory, concentrations of many elements can be determined down to 0,2% in particles that are only a few square micrometers in size.










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